Accurate hotspot localization by sampling the near-field pattern of electronic devices

摘要

This paper describes a new automated scanning algorithm to identify hotspots (regions with electric or magnetic near-field values above a specific threshold) in the planar near-field profile of electronic systems. The algorithm sequentially determines a set of optimal scanning coordinates where experimental measurements should be performed. The result of the process is a heat map that clearly outlines the presence and localization of hotspots. The efficacy of the proposed algorithm is validated on a measured and a simulated example.